QFN测试插座/老化插座

QFN测试插座/老化插座

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菱美电子提供最全的QFN/MLF/DFN等封装之IC测试/老化测试插座,脚距从0.4mm至1.0mm,常用型号均备有大量现货.同时依托欧洲领先的BGA/QFN测试产品生产工艺,为客户提供优质的QFN/MLF/DFN测试插座产品,并可根据客户芯片的规格,提供定制化的服务.

SPECIFICATIONS (mm):

• Available in .40, .50, .65, .80 and 1.00 mm pitches
• Custom pitches down to .30 mm
• Lidded and Open Top Sockets for 3 mm - 10 mm packages
• Lidded Sockets for 10 - 16 mm packages
• Center ground pin standard for all sockets
• Optional copper heat slug available for high wattage devices
• Sockets for over 80 different JEDEC standard footprints


QFN高频测试座 (适合任何封装尺寸,完全定制)

更多资料请浏览本公司网页获取 www.lingmei.com.cn